Published January 2010
| Version v1
Journal article
SimulaTEM: Multislice simulations for general objects
- 1. Departamento de Materia Condensada, Instituto de Fisica, Universidad National Autonoma de Mexico, Mexico, D.F. C.P. 04510 (Mexico)
Description
In this work we present the program SimulaTEM for the simulation of high resolution micrographs and diffraction patterns. This is a program based on the multislice approach that does not assume a periodic object. It can calculate images from finite objects, from amorphous samples, from crystals, quasicrystals, grain boundaries, nanoparticles or arbitrary objects provided the coordinates of all the atoms can be supplied.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2009.09.010Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2009.09.010;
- PII
- S0304-3991(09)00206-X;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 110
- Journal Issue
- 2
- Journal Page Range
- p. 95-104
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44102685
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ATOMS; COMPUTERIZED SIMULATION; CRYSTALS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; IMAGE PROCESSING; IMAGES; NANOSTRUCTURES; PARTICLES; PERIODICITY; RESOLUTION; S CODES
- Descriptors DEC
- COHERENT SCATTERING; COMPUTER CODES; DIFFRACTION; MICROSCOPY; MICROSTRUCTURE; PROCESSING; SCATTERING; SIMULATION; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.