Published April 30, 2009
| Version v1
Journal article
Simultaneous irradiation effects of hydrogen and helium ions on tungsten
- 1. Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871 (Japan)
- 2. Research Institute for Applied Mechanics, Kyushu University, Fukuoka (Japan)
Description
Simultaneous irradiation effects of He on tungsten blistering with hydrogen and carbon mixed ion irradiation were investigated. It was found that only 0.1% addition of He ions to 1 keV H and C mixed ion beam (C: 0.8-1.0%) reduced (473 K) or completely suppressed (653 K and 723 K) blister formation. According to TEM observation, He bubbles with the size of 2 nm or less were formed near the surface, which could be a diffusion barrier of hydrogen into the bulk due to the reduction of diffusion channel or excitation of stress field, leading to the reduction of diffusivity of hydrogen. The reduction rate of hydrogen inward flux by simultaneous He irradiation in our experimental conditions would be more than the factor of three.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2008.12.300Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2008.12.300;
- PII
- S0022-3115(08)00969-0;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 386-388
- Journal Page Range
- p. 725-728
- ISSN
- 0022-3115
- CODEN
- JNUMAM
Conference
- Title
- 13. international conference on fusion reactor materials
- Dates
- 10-14 Dec 2007
- Place
- Nice (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41065776
- Subject category
- S36: MATERIALS SCIENCE; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BLISTERS; BUBBLES; CARBON; DIFFUSION; DIFFUSION BARRIERS; EXCITATION; HELIUM IONS; HYDROGEN; ION BEAMS; IRRADIATION; KEV RANGE; STRESSES; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; IONS; METALS; MICROSCOPY; NONMETALS; REFRACTORY METALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.