Published 1990
| Version v1
Book
Charged particle activation
Description
In this paper, the authors summarize the main features of charged particle activation and give typical examples of application. The strongest point of charged particle activation is its ability to achieve trace analysis, down to the ppb level (10-9). It is probably the best method for the analysis of ubiquitous elements like C, N and O at trace level; some emphasis will be given to the analysis of C, N and O in metals and semi- conductors. Charged particle activation is also of interest for other elements at trace level in a number of cases: it has been used in geology, biology and in environmental studies
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (USA)
- ISBN
- 0-55899-091-7
- Imprint Title
- High energy and heavy ion beams in materials analysis
- Imprint Pagination
- 290 p.
- Journal Page Range
- p. 221-234.
Conference
- Title
- Materials Research Society high energy and heavy ion beams in materials analysis workshop.
- Dates
- 14-16 Jun 1989.
- Place
- Albuquerque, NM (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22002068
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACTIVATION ANALYSIS; CARBON; CORROSION; IMPURITIES; NITROGEN; OXYGEN; SEMICONDUCTOR MATERIALS; STRUCTURAL CHEMICAL ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; CHEMICAL REACTIONS; ELEMENTS; MATERIALS; NONDESTRUCTIVE ANALYSIS; NONMETALS
Optional Information
- Secondary number(s)
- CONF-8906186--.