Quantitative analysis of soil by using X-ray fluorescence spectrometry (WDXRFS)

Development of the new technologies has been using a lot of substances composed by metals, consequently generating reject for the environment. There is nowadays a concern in management and to control processes that contribute to the environmental degradation. This paper has the purpose to establish an analysis method for the quantitative determination of major and trace elements soil used the Technique of Wavelength Dispersion X-ray Fluorescence Spectrometry (WDRXFS) and the Fundamental Parameters Method. This method allows calculating the theoretical fluorescent intensities obtained by the measured intensities of the elements present in the sample, through the instrumental sensibility. Advantages of this methodology are: use of small amount of sample, accuracy high and sensibility in the determinations studied analyte; not use of chemical treatments in the preparation of samples; speed and cost relatively low. Methodology was validated by the analyze of five certified reference materials, CRM-2704 - Buffalo River Sediment (NIST), JB2, JG1 and JG1a - Geological Survey of Japan (GSJ) and SL-3 -Lake Sediment (IAEA). An X- Ray Fluorescence Spectrometer RIGAKU was used, RIX 3000, 1996 of the Laboratory X-Ray Fluorescence, Center of Chemistry and environment of the Institute of Energy and Nuclear Researches of Sao Paulo. The detection limit for major elements is 0,01-0,2% and trace elements 5 μg/g-100 μg/g. The analytes studied were: SiO2, TiO2, Al2O3, Fe2O3, MnO, MgO, CaO, Na2O, K2O, P2O5, Ag, As, Cd, Ce, Cr, Cu, Ga, Hg, La, Nd, Ni, Pb, Rb, Se, Sr, V, Y, Zn and Zr. (author)