Published October 1975 | Version v1
Journal article Metadata-only

Radiation testing of an 8-bit CMOS microprocessor

Creators

  • 1. Naval Research Lab., Washington, DC

Description

An 8-bit CMOS microprocessor has been tested in an ionizing radiation environment. Quiescent current was monitored during the irradiation and clock frequency was a test parameter. Irradiated in a static condition, failure was observed at a total dose of 3 x 104 rads (Si). (auth)

Additional details

Identifiers

DOI
10.1109/tns.1975.4328075;

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
22
Journal Issue
5
Series
IEEE (Inst. Electr. Electron. Eng.) Trans. Nucl. Sci.
Journal Page Range
2120-2120
ISSN
0018-9499

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
7229417
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
FAILURES; INTEGRATED CIRCUITS; MOS TRANSISTORS; PHYSICAL RADIATION EFFECTS; TESTING
Descriptors DEC
ELECTRONIC CIRCUITS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; TRANSISTORS

Optional Information

Notes
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