Published November 2006
| Version v1
Report
Polarization characteristic of CDTE diode radiation detector
- 1. Shizuoka Univ., Research Inst. of Electrics, Hamamatsu, Shizuoka (Japan)
Description
The spectrum measurement of these detectors was confirmed that the effect of polarization was reduced by increasing reverse bias voltage and decreasing operating temperature. The effect of polarization in these detectors were similarly occurred. From this fact, if was confirmed that polarization is not only the phenomenon of schottky barrier and also is the phenomenon of bulk crystal. The cause of polarization was the decrease of depletion layer width and the increase of current. The cause of decrease of depletion layer width and the cause of increase of current was the phenomenon of deep acceptor. From this fact, it was confirmed that the cause of polarization was the phenomenon of deep acceptor. (author)
Additional details
Publishing Information
- Imprint Title
- Radiation detectors and their uses. Proceedings of the 20th workshop on radiation detectors and their uses
- Imprint Pagination
- 222 p.
- Journal Page Range
- p. 151-160
- Report number
- KEK-PROC--2006-7
Conference
- Title
- 20. workshop on radiation detectors and their uses
- Dates
- 1-3 Feb 2006
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 38094589
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- CADMIUM TELLURIDES; CAPACITANCE; DOPED MATERIALS; ENERGY SPECTRA; IMAGES; INDIUM; KRYPTON FLUORIDE LASERS; LEAKAGE CURRENT; PERFORMANCE TESTING; POLARIZATION; RADIATION DETECTORS; TIME DEPENDENCE; X-RAY RADIOGRAPHY
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CURRENTS; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELEMENTS; EXCIMER LASERS; GAS LASERS; INDUSTRIAL RADIOGRAPHY; LASERS; MATERIALS; MATERIALS TESTING; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE TESTING; PHYSICAL PROPERTIES; SPECTRA; TELLURIDES; TELLURIUM COMPOUNDS; TESTING
Optional Information
- Notes
- 7 refs., 7 figs.