Single crystalline metal films as substrates for graphene growth
Creators
- 1. Department Chemie, Ludwig-Maximilians-Universitaet Muenchen (Germany)
- 2. Institut fuer Physik, Universitaet Augsburg (Germany)
- 3. Institut fuer Physik, Technische Universitaet Chemnitz (Germany)
- 4. Lehrstuhl fuer Technische Physik, Universitaet Erlangen-Nuernberg, Erlangen (Germany)
Description
Single crystalline metal films deposited on YSZ-buffered Si(111) wafers were investigated with respect to their suitability as substrates for epitaxial graphene. Graphene was grown by CVD of ethylene on Ru(0001), Ir(111), and Ni(111) films in UHV. For analysis a variety of surface science methods were used. By an initial annealing step the surface quality of the films was strongly improved. The temperature treatments of the metal films caused a pattern of slip lines, formed by thermal stress in the films, which, however, did not affect the graphene quality and even prevented wrinkle formation. Graphene was successfully grown on all three types of metal films in a quality comparable to graphene grown on bulk single crystals of the same metals. In the case of the Ni(111) films the originally obtained domain structure of rotational graphene phases could be transformed into a single domain by annealing. This healing process is based on the control of the equilibrium between graphene and dissolved carbon in the film. For the system graphene/Ni(111) the metal, after graphene growth, could be removed from underneath the epitaxial graphene layer by a pure gas phase reaction, using the reaction of CO with Ni to give gaseous Ni(CO)4. (copyright 2017 by WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)
Availability note (English)
Available from: http://dx.doi.org/10.1002/andp.201700023Additional details
Identifiers
Publishing Information
- Journal Title
- Annalen der Physik (Leipzig)
- Journal Volume
- 529
- Journal Issue
- 11
- Series
- Science and technology of graphene
- Journal Page Range
- p. 1-14
- ISSN
- 0003-3804
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 49021222
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; AUGER ELECTRON SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; ELECTRON DIFFRACTION; GRAPHENE; IRIDIUM; MONOCRYSTALS; MORPHOLOGY; NICKEL; ORIENTATION; RUTHENIUM; SCANNING ELECTRON MICROSCOPY; SILICON; SUBSTRATES; THIN FILMS; VAPOR PHASE EPITAXY; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBON; CHEMICAL COATING; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTALS; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; EPITAXY; FILMS; HEAT TREATMENTS; METALS; MICROSCOPY; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PLATINUM METALS; REFRACTORY METALS; SCATTERING; SEMIMETALS; SPECTROSCOPY; SURFACE COATING; TRANSITION ELEMENTS
Optional Information
- Notes
- With 10 figs.