On-board event processing algorithms for a CCD-based space borne X-ray spectrometer
- 1. University Coll., London (United Kingdom). Mullard Space Science Lab.
Description
This paper describes two alternative algorithms which are applied to reduce the telemetry requirements for a Charge Coupled Device (CCD) based, space-borne, X-ray spectrometer by on-board reconstruction of the X-ray events split over two or more adjacent pixels. The algorithms have been developed for the Reflection Grating Spectrometer (RGS) on the X-ray multi-mirror (XMM) mission, the second cornerstone project in the European Space Agency's Horizon 2000 programme. The overall instrument and some criteria which provide the background of the development of the algorithms, implemented in Tartan ADA on an MA31750 microprocessor, are described. The on-board processing constraints and requirements are discussed, and the performances of the algorithms are compared. Test results are presented which show that the recursive implementation is faster and has a smaller executable file although it uses more memory because of its stack requirements. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 376
- Journal Issue
- 2
- Journal Page Range
- p. 254-262.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 27066338
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; CHARGE-COUPLED DEVICES; COMPUTER CALCULATIONS; IMAGE PROCESSING; MICROPROCESSORS; POSITION SENSITIVE DETECTORS; PROGRAMMING; SEMICONDUCTOR DETECTORS; SPACE FLIGHT; SPECTRA UNFOLDING; X-RAY DETECTION; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- DATA PROCESSING; DETECTION; ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DEVICES; SPECTROMETERS; SPECTROSCOPY