A comparison of detection limits using 2.13 and 2.55 MeV protons and 6.07, 7.00, 8.52 and 9.12 MeV 4He2+ for some common substrates
Description
PIXE (Particle Induced X-ray Emission analysis) has been established as a method of trace element analysis. This work compares the detection limits using 2.13 and 2.55 MeV protons with those attainable using 4He2+ -ions of energies 6.07, 7.00, 8.52 and 9.12 MeV as projectile. This comparison was carried out using three common aerosol substrates: Kimfol, Nuclepore and Teflon. The detection limits using protons or 4He2+ -ions were of the same order but the lower detection limits with 4He2+ -ions according to theory were not observed, largely due to a higher intensity of gamma-quanta being Compton-scatterd in the Si(Li) detector. An improvement of the experimental chamber making it more suitable for 4He2+ -ions should lower the detection limits using 4He2+ as projectile. (author)
Availability note (English)
MF available from INIS under the Report Number.Files
16002526.pdf
Files
(1.4 MB)
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Additional details
Additional titles
- Original title (Swedish)
- En jaemfoerelse av detektionsgraenserna vid PIXE-spaaraemnesanalys mellan 2.13 och 2.55 MeV protoner och 6.07, 7.00, 8.52 och 9.12 MeV
Publishing Information
- Imprint Pagination
- 53 p.
- Report number
- LUTFD2/TFKF--5013/1-51(1984)
INIS
- Country of Publication
- Sweden
- Country of Input or Organization
- Sweden
- INIS RN
- 16002526
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- HELIUM 4 BEAMS; PIXE ANALYSIS; PROTON BEAMS; SENSITIVITY; TRACE AMOUNTS
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; ION BEAMS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; X-RAY EMISSION ANALYSIS