Published April 1981
| Version v1
Journal article
A proton microprobe for the investigation of lateral distributions of trace elements by means of PIXE
- 1. Bochum Univ. (Germany, F.R.). Inst. fuer Experimentalphysik
- 2. Koeln Univ. (Germany, F.R.). Hautklinik
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Verh. Dtsch. Phys. Ges.
- Journal Volume
- 16
- Journal Issue
- 6
- Series
- Verh. Dtsch. Phys. Ges.
- Journal Page Range
- 759
- ISSN
- 0420-0195
Conference
- Title
- 45. Physicists' meeting Hamburg 1981 and spring meeting Hamburg 1981 of the DPG.
- Dates
- 23 - 27 Mar 1981.
- Place
- Hamburg, Germany, F.R.
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 12618061
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BEAM PROFILES; ELEMENTS; MEV RANGE 01-10; PERFORMANCE TESTING; PROTON BEAMS; PROTON MICROPROBE ANALYSIS; SPATIAL DISTRIBUTION; TRACE AMOUNTS; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; DISTRIBUTION; ENERGY RANGE; MEV RANGE; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; TESTING
Optional Information
- Notes
- Published in summary form only.