Computer techniques and software for industrial applications of energy dispersive X-ray fluorescence analysis
- 1. Bylgarska Akademiya na Naukite, Sofia. Inst. za Yadrena Izsledvaniya i Yadrena Energetika
Description
Energy-dispersive X-ray fluorescence (EDXRF) is a relatively new technique which at present is extensively used as a routine analytical tool for research, quality control, process monitoring, etc. The latest generation of EDXRF systems instead of using a separate multichannel analyzer and computer is completely built in connection to a microprocessor. A such configuration of EDXRF spectrometer 'X-ray 40' is elaborated in the Institute for Nuclear Research and Nuclear Energy. This kind of architecture is quite appropriate for industrial application as the systems are cheeper, more reliable and easier to maintain. The software requirements for industrial applications are derived from analytical needs: precision, accuracy, concentration range, cost and time for analysis. The computerised EDXRF spectrometer fulfils these needs when the appropriate software is an integral part of the X-ray system. (author)
Additional details
Publishing Information
- Imprint Title
- Proceedings of the third Working Meeting Radioisotope Application and Radiation Processing in Industry. Vol. 2
- Imprint Pagination
- 297 p.
- Journal Page Range
- p. 633-640.
Conference
- Title
- 3. working meeting on radioisotope application and radiation processing in industry.
- Dates
- 23-27 Sep 1985.
- Place
- Leipzig (German Democratic Republic).
INIS
- Country of Publication
- German Democratic Republic
- Country of Input or Organization
- German Democratic Republic
- INIS RN
- 19054191
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- COMPUTERS; INDUSTRY; PROGRAMMING LANGUAGES; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
- Descriptors DEC
- CHEMICAL ANALYSIS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; SPECTROMETERS; X-RAY EMISSION ANALYSIS