Published 1986 | Version v1
Miscellaneous

Computer techniques and software for industrial applications of energy dispersive X-ray fluorescence analysis

  • 1. Bylgarska Akademiya na Naukite, Sofia. Inst. za Yadrena Izsledvaniya i Yadrena Energetika

Description

Energy-dispersive X-ray fluorescence (EDXRF) is a relatively new technique which at present is extensively used as a routine analytical tool for research, quality control, process monitoring, etc. The latest generation of EDXRF systems instead of using a separate multichannel analyzer and computer is completely built in connection to a microprocessor. A such configuration of EDXRF spectrometer 'X-ray 40' is elaborated in the Institute for Nuclear Research and Nuclear Energy. This kind of architecture is quite appropriate for industrial application as the systems are cheeper, more reliable and easier to maintain. The software requirements for industrial applications are derived from analytical needs: precision, accuracy, concentration range, cost and time for analysis. The computerised EDXRF spectrometer fulfils these needs when the appropriate software is an integral part of the X-ray system. (author)

Additional details

Publishing Information

Imprint Title
Proceedings of the third Working Meeting Radioisotope Application and Radiation Processing in Industry. Vol. 2
Imprint Pagination
297 p.
Journal Page Range
p. 633-640.

Conference

Title
3. working meeting on radioisotope application and radiation processing in industry.
Dates
23-27 Sep 1985.
Place
Leipzig (German Democratic Republic).

INIS

Country of Publication
German Democratic Republic
Country of Input or Organization
German Democratic Republic
INIS RN
19054191
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
COMPUTERS; INDUSTRY; PROGRAMMING LANGUAGES; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
Descriptors DEC
CHEMICAL ANALYSIS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; SPECTROMETERS; X-RAY EMISSION ANALYSIS