Published June 1994
| Version v1
Journal article
The effect of the Grain-Boundary and surface scattering of charge carriers on electrical conductance of thin V and Re films
Description
Size effects in electrical conductivity and the Hall coefficient of thin V and Re films have been investigated. An analysis of experimental data was made within the framework of modified Mayadas -Shatzkes and Tellier - Tosser - Pichard models. The parameters of charge transport for V and Re have been found
Additional details
Additional titles
- Original title (Ukrainian)
- Vpliv zernomezhovogo ta poverkhnevogo rozsyiyuvannya nosyiyiv strumu na elektroprovyidnyist' tonkikh plyivok vanadyiyu ta renyiyu
Publishing Information
- Journal Title
- Ukrainskij Fizicheskij Zhurnal
- Journal Volume
- 39
- Journal Issue
- 6
- Journal Page Range
- p. 739-742.
- ISSN
- 0503-1265
- CODEN
- UFIZAW
INIS
- Country of Publication
- Ukraine
- Country of Input or Organization
- Ukraine
- INIS RN
- 26044162
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHARGE CARRIERS; CHARGE TRANSPORT; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; HALL EFFECT; MEAN FREE PATH; RHENIUM; SCATTERING; THIN FILMS; VANADIUM
- Descriptors DEC
- CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; METALS; MICROSTRUCTURE; PHYSICAL PROPERTIES; TRANSITION ELEMENTS