Published 1997
| Version v1
Book
Particle diffraction at high energies
Description
The aim of the paper is to substantiate studying the particle diffraction (PD) at high energies. Two reasons are presented. 1. Energy-dependent shape of the PD interaction range is interesting both from the general quantum and rela relativistic point of view. 2. The interpretation of PD data can promote the new development of QCD at large space-time scales; this is definitely related to the confinement problem
Abstract (Russian)
Обосновывается важность изучения дифракции частиц (ДЧ) при высоких энергиях. Рассматриваются две причины. 1. Форма ДЧ области взаимодействия, зависящая от энергии, интересна как с общеквантовой, так и с релятивистской точек зрения. 2. Интерпретация данных по ДЧ может способствовать новому развитию КХД при больших пространственно-временных масштабах, что в свою очередь непосредственно связано с проблемой удержанияAdditional details
Publishing Information
- Publisher
- State Research Center of Russia, Institute for High Energy Physics
- Imprint Place
- Protvino (Russian Federation)
- ISBN
- 5-88738-019-5
- Imprint Title
- Fundamental problems of high energy physics and field theory. Proceedings of the 20. Workshop on high energy physics and field theory
- Imprint Pagination
- 287 p.
- Journal Page Range
- p. 104-106
Conference
- Title
- 20. Workshop on high energy physics and field theory
- Dates
- 24-26 Jun 1997
- Place
- Protvino (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 32039102
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BAG MODEL; DATA ANALYSIS; DIFFRACTION MODELS; ENERGY DEPENDENCE; INTERACTION RANGE; PARTICLE PRODUCTION; QUANTUM CHROMODYNAMICS; SPACE-TIME
- Descriptors DEC
- COMPOSITE MODELS; DISTANCE; EXTENDED PARTICLE MODEL; FIELD THEORIES; MATHEMATICAL MODELS; PARTICLE MODELS; QUANTUM FIELD THEORY; QUARK MODEL
Optional Information
- Notes
- 5 refs.