Published November 1984
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Structure factor determination by electron diffraction
Description
A selection of methods for structure factor determination by electron diffraction is presented. Results obtained by the different methods are compared with regard to accuracies in structure determination
Availability note (English)
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17041692.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 11 p.
- Report number
- OUP--84-29
INIS
- Country of Publication
- Norway
- Country of Input or Organization
- Norway
- INIS RN
- 17041692
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACCURACY; COMPARATIVE EVALUATIONS; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; STRUCTURE FACTORS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; EVALUATION; MICROSCOPY; SCATTERING