Published May 25, 2003 | Version v1
Journal article

X-ray study of cerium oxide doped with gadolinium oxide fired at low temperatures

Description

Cerium oxide with different amount of GdO1.5 was prepared by co-precipitation method and fired at temperatures from 600 to 1300 deg. C. The samples were characterized by using X-ray diffraction. The result indicated that in the concentration range of 0-30 mol.% GdO1.5, the samples were in fluorite structure and followed Vegard's law. In the concentration range of 40-50 mol.% GdO1.5, the samples showed the existence of the peaks which did not correspond to fluorite structure and the lattice parameter was independent of gadolinium content. The lattice parameters did not change with extension of annealing time at 600-800 deg. C

Additional details

Identifiers

DOI
10.1016/S0921-5107(02)00546-9;
arXiv
arXiv:hep-th/0103148v3;
PII
S0921510702005469;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
99
Journal Issue
1-3
Journal Page Range
p. 48-51
ISSN
0921-5107
CODEN
MSBTEK

Conference

Title
8. IUMRS international conference on electronic materials
Acronym
IUMRS-ICEM2002 - Symposium N
Dates
10-14 Jun 2002
Place
Xi'an (China)

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.