Published February 2009 | Version v1
Journal article Metadata-only

Plasticity of nanostructured Cu-Nb-based wires: Strengthening mechanisms revealed by in situ deformation under neutrons

Creators

  • 1. CROMeP, ENSTIMAC, Campus Jarlard, 81013 Albi (France)
  • 2. PHYMAT, Universite de Poitiers, SP2MI, 86960 Futuroscope (France)
  • 3. Paul Scherrer Institut, Villigen-PSI CH-5232 (Switzerland)
  • 4. Laboratory of Neutron Scattering, ETH Zuerich and Paul Scherrer Institut, Villigen-PSI CH-5232 (Switzerland)
  • 5. Laboratoire National des Champs Magnetiques Pulses, CNRS-UPS-INSA, 143 Avenue de Rangueil, 31400 Toulouse (France)

Description

Cu/Nb/Cu conductors composed of a multiscale Cu matrix embedding Nb nanotubes were studied using in situ tensile testing during neutron diffraction. The evolution of lattice strains during deformation revealed the different elastoplastic regimes in the multiscale Cu matrix and the Nb nanotubes. The Cu nanofilaments embedded in the Nb nanotubes behaved as whiskers with a strong size dependence. The results are compared with Cu/Nb nanofilamentary wires and differences in strengthening mechanism are explained in terms of microstructure

Availability note (English)

Available from http://dx.doi.org/10.1016/j.scriptamat.2008.09.032

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2008.09.032;
PII
S1359-6462(08)00710-0;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
60
Journal Issue
3
Journal Page Range
p. 171-174
ISSN
1359-6462
CODEN
SCMAF7

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40077585
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COMPOSITE MATERIALS; COPPER; DEFORMATION; MICROSTRUCTURE; NANOTUBES; NEUTRON DIFFRACTION; NIOBIUM; PLASTICITY; STRAINS; WHISKERS
Descriptors DEC
COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTS; MATERIALS; MECHANICAL PROPERTIES; METALS; MONOCRYSTALS; NANOSTRUCTURES; REFRACTORY METALS; SCATTERING; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.