Method for single-shot measurement of picosecond laser pulse-lengths without electronic time dispersion
Creators
- 1. Los Alamos National Lab., Physics Div., P.O. Box 1663, MS E526, Los Alamos, NM (USA)
Description
A two-source shear pattern recording is proposed as a method for single-shot measurement of the pulse shape from nearly monochromatic sources whose pulse lengths are shorter than their coherence times. The basis of this method relies on the assertion that if two identical electromagnetic pulses are recombined with a time delay greater than the sum of their pulse widths, the recordable spatial pattern has no fringes in it. At an arbitrary delay, translated into an actual spatial recording position, the recorded modulated intensity will sample the corresponding laser intensity at that delay time, but with a modulation due to the coherence function of the electromagnetic pulse. Two arrangements are proposed for recording the pattern. The principles, the design parameters, and the methodologies of these arrangements are presented. Resolutions of the configurations and their limitations are given as well
Additional details
Publishing Information
- Publisher
- SPIE Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (USA)
- Imprint Title
- High speed photography, videography, and photonics V
- Journal Page Range
- p. 203-209.
Conference
- Title
- High speed photography, videography, and photonics V.
- Dates
- 17-19 Aug 1987.
- Place
- San Diego, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 20026968
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COHERENT RADIATION; CONFIGURATION; ELECTROMAGNETIC PULSES; LASERS; MEASURING METHODS; MONOCHROMATORS; MULTI-PARAMETER ANALYSIS; PULSE SHAPERS; PULSE TECHNIQUES; SPECIFICATIONS
- Descriptors DEC
- AMPLIFIERS; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; EQUIPMENT; PULSE CIRCUITS; RADIATIONS