Electrical characteristics of PbO–CaO–TiO2–SiO2–B2O3 glass ceramics doped with germanium
Creators
- 1. North Eastern Regional Institute of Science and Technology, Department of Mechanical Engineering (India)
- 2. University of Lucknow, Advanced Glass and Glass Ceramics Research Laboratory, Department of Physics (India)
- 3. North Eastern Regional Institute of Science and Technology, Department of Physics (India)
Description
Various glass samples in the compound 55[(PbxCa1−x)O⋅TiO2]-44[2SiO2⋅B2O3]-1Ge (0 ≤ x ≤ 0.7) were fabricated by using the melt-quenching technique and their glass ceramics (GC) were obtained by controlled crystallization of the glass samples. The identification of phase and crystal structure with measurement of cell parameters was carried out using X-ray diffractometer (XRD). XRD results revealed the presence of the single phase formation of rutile (TiO2). The surface morphology of the synthesized GC samples was evaluated using a scanning electron microscope (SEM). The electrical behaviour of three selected GC samples with x = 0.0, 0.3 and 0.7 was being widely studied using impedance and immittance spectroscopy. The lead free GC sample, x = 0.0 possesses a high dielectric constant, 91,252 at low frequency (50 Hz) and high temperature (500 °C) due to space charge polarization that was ascertained by impedance spectroscopy of the tested samples. The fitting of impedance spectra with a modelled equivalent circuit was performed and different values of resistance and capacitance were calculated.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 3
- Journal Page Range
- p. 2431-2441
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52016661
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BORATES; BORON OXIDES; CALCIUM OXIDES; CERAMICS; CRYSTAL STRUCTURE; DIELECTRIC MATERIALS; DOPED MATERIALS; EQUIVALENT CIRCUITS; GERMANIUM OXIDES; GLASS; LEAD OXIDES; OXIDATION; SCANNING ELECTRON MICROSCOPY; SILICON OXIDES; SYNTHESIS; TITANIUM OXIDES; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BORON COMPOUNDS; CALCIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; ELECTRON MICROSCOPY; ELECTRONIC CIRCUITS; GERMANIUM COMPOUNDS; LEAD COMPOUNDS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICON COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature