Time-domain diagnostics in the picosecond regime

The measurement of bunch length and longitudinal profile for microbunches of electrons and positrons in the ps and sub-ps regime will be a critical part of validating performance of proposed facilities. Data will be presented showing single-sweep streak camera results at σres∼68 fs and projected synchroscan sweep resolution at σ∼600 fs. Additionally, an rf cavity operating in a transverse magnetic mode has recently been shown to produce σres∼280 fs when used with a low-emittance beam. The potential for dual-sweep streak work with σres<1 ps on the fast axis is also described. copyright 1996 American Institute of Physics