Published November 1982
| Version v1
Report
Rare pion decays
Description
The status and outlook for studies of some rare pion decays is discussed. Improved charged pion beams and tagged π0 beams derived from an intense source of K/sub π/2 decays will provide new opportunities for experiments at LAMPF II and the Kaon Factory
Additional details
Publishing Information
- Imprint Title
- Proceedings of the second LAMPF II workshop
- Journal Page Range
- p. 221-231.
- Report number
- LA--9572-C-Vol.1
Conference
- Title
- 2. LAMPF workshop.
- Dates
- 19-22 Jul 1982.
- Place
- Los Alamos, NM (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14774235
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BRANCHING RATIO; COLOR MODEL; ELECTROMAGNETIC INTERACTIONS; LAMPF II SYNCHROTRON; PARTICLE DECAY; PIONS MINUS; PIONS NEUTRAL; PIONS PLUS; PLANNING; STRONG INTERACTIONS; WEAK INTERACTIONS
- Descriptors DEC
- ACCELERATORS; ANTIMATTER; ANTIMESONS; ANTIPARTICLES; BASIC INTERACTIONS; BOSONS; COMPOSITE MODELS; CYCLIC ACCELERATORS; DECAY; ELEMENTARY PARTICLES; HADRONS; INTERACTIONS; MATHEMATICAL MODELS; MATTER; MESON FACTORIES; MESONS; PARTICLE MODELS; PIONS; PSEUDOSCALAR ANTIMESONS; PSEUDOSCALAR MESONS; QUARK MODEL; SYNCHROTRONS