Development of a transmission positron microscope
Creators
- 1. JEOL Ltd., 1-2 Musashino, 3-Chome, Akishima, Tokyo 196-8558 (Japan)
- 2. Department of Applied Chemistry, Chiba University, Yayoi, Inage, Chiba, Chiba 263-8552 (Japan)
- 3. High Energy Accelerator Research Organization, Oho, Tsukuba, Ibaraki 305-0801 (Japan)
- 4. Teikyo University of Science and Technology, Uenohara, Yamanashi 409-0913 (Japan)
Description
A practical transmission positron microscope (TPM) JEM-1011B has been developed to survey differences in the interaction of positron and electron beams with materials, and is installed in the Slow Positron Facility of High Energy Accelerator Research Organization (KEK). The TPM can share positron and electron beams, and can also be used as a transmission electron microscope (TEM). Positron transmission images up to magnification 10,000x (resolution: 50 nm) and positron diffraction patterns up to 044 family were successfully obtained by the TPM comparing them with those of electrons. The differences in material transmittances for both beams have been measured, and can be explained by the calculated results of the Monte Carlo simulation code PENELOPE-2008.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.12.228Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.12.228;
- PII
- S0168-9002(10)03054-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 645
- Journal Issue
- 1
- Journal Page Range
- p. 102-112
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 8. international conference on charged particle optics
- Acronym
- CPO-8
- Dates
- 12-16 Jul 2010
- Place
- Singapore (Singapore)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43055625
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATORS; BRIGHTNESS; COMPUTERIZED SIMULATION; DIFFRACTION; ELECTRON BEAMS; ELECTRON MICROSCOPES; IMAGES; JAPANESE ORGANIZATIONS; MATERIALS; MONTE CARLO METHOD; POSITRONS; TRANSMISSION; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BEAMS; CALCULATION METHODS; COHERENT SCATTERING; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTON BEAMS; LEPTONS; MATTER; MICROSCOPES; MICROSCOPY; NATIONAL ORGANIZATIONS; OPTICAL PROPERTIES; PARTICLE BEAMS; PHYSICAL PROPERTIES; SCATTERING; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.