Light Collection in the High Energy X-ray Detector with the Pixelated CdWO4 Scintillator using Monte Carlo Method

The performance of indirect detectors, which use the scintillator as CdWO₄, BGO, CsI, NaI, etc., are effected by optical properties of scintillator and geometrical condition of scintillator. Some of generated lights by interaction between x-ray photons and scintillator are collected at the photo-sensor and others are absorbed in scintillator or escape out of detector. In order to make the high performance image detector, detector should be able to gather the generated lights as much as possible. To minimize the loss of generated lights, thickness of scintillator is to be chosen appropriately. Therefore, the quality of the image detector using the pixelated scintillator is determined by scintillator size, reflectance of scintillator surface, electric noise, etc. In this study, we carried out a study the correlation between the number of collected light and the change of thickness of scintillator using Monte Carlo method. As shown in results, the optimal thickness of a scintillator should be properly selected depending on the incident x-ray energy. In case of without reflector, the scintillator thickness range for x-ray detection is thinner than other cases (with reflector). In the case of a scintillator with reflector, number of collected light and the optima thickness of a scintillator is higher and thicker than scintillator without reflector