Novel device applications employing LPCVD tungsten
- 1. Gould Research Center, Rolling Meadows, IL 60008
Description
By combining the selective nature of the LPCVD tungsten deposition method with micromachining and laser processing techniques, several microelectronic devices have been developed. These include ultrathin tungsten filaments, tungsten loops, a silicon-to-tungsten converted, laser-recrystallized, field-effect transistor on insulator, and tungsten cladding of laser-written polysilicon interconnects. The filaments are used to investigate one- and/or two-dimensional fundamental physical effects, such as localization or electron-electron interaction behavior at cryogenic temperatures. The loops are used to investigate the Aharanov-Bohm effect which produces an oscillatory magnetoresistance pattern due to phase differences of the electron wavefunctions along the two paths of the loops. The transistor promises applications in high-density, radiation hardened VLSI circuits. The low resistance, laser-written interconnect process promises applications in the customization of integrated circuits
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (USA)
- ISBN
- 0-931837-32-4
- Imprint Title
- Tungsten and other refractory metals for VLSI applications
- Journal Page Range
- p. 283-295.
Conference
- Title
- Workshop on tungsten and other refractory metals.
- Dates
- 7-9 Oct 1985.
- Place
- Albuquerque, NM (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18032394
- Subject category
- S42: ENGINEERING; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL VAPOR DEPOSITION; CONNECTORS; CRYOGENICS; ELECTRICAL INSULATORS; ELECTRON-ELECTRON INTERACTIONS; FABRICATION; FIELD EFFECT TRANSISTORS; FILAMENTS; INTEGRATED CIRCUITS; LASER BEAM MACHINING; MAGNETORESISTANCE; MATERIALS; MICROELECTRONIC CIRCUITS; OSCILLATIONS; PHYSICAL PROPERTIES; POLYCRYSTALS; PRESSURE DEPENDENCE; RADIATION HARDENING; RECRYSTALLIZATION; SILICON; TEMPERATURE DEPENDENCE; TUNGSTEN; WAVE FUNCTIONS
- Descriptors DEC
- CHEMICAL COATING; CONDUCTOR DEVICES; CRYSTALS; DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; ELEMENTS; EQUIPMENT; FUNCTIONS; HARDENING; INTERACTIONS; LEPTON-LEPTON INTERACTIONS; MACHINING; METALS; PARTICLE INTERACTIONS; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMIMETALS; SURFACE COATING; TRANSISTORS; TRANSITION ELEMENTS