Unit for absolute calibration of spectral sensitivity of X-ray semiconductor detectors

A method for determining spectral characteristics of X-ray detector in the 1-100 keV X-ray quanta energy range is proposed. Absolute spectral detector sensitivity is determined with the aid of calorimeters in the form of two absorbing lead discs of 0.38 cm2 area and 0.2 cm thickness. The results of measurement of spectral sensitivity of semiconductor detectors in three energy ranges are given. The measured values of detector spectral sensitivity in the low energy range (<40 keV) substantially differ from the calculated sensitivity with accuracy 15 %