Published February 10, 2014
| Version v1
Journal article
Entanglement-assisted electron microscopy based on a flux qubit
Creators
- 1. Department of Electronics and Information Systems, Akita Prefectural University, Yurihonjo 015-0055 (Japan)
- 2. National Institute for Physiological Sciences, Okazaki 444-8787 (Japan)
Description
A notorious problem in high-resolution biological electron microscopy is radiation damage caused by probe electrons. Hence, acquisition of data with minimal number of electrons is of critical importance. Quantum approaches may represent the only way to improve the resolution in this context, but all proposed schemes to date demand delicate control of the electron beam in highly unconventional electron optics. Here we propose a scheme that involves a flux qubit based on a radio-frequency superconducting quantum interference device, inserted in a transmission electron microscope. The scheme significantly improves the prospect of realizing a quantum-enhanced electron microscope for radiation-sensitive specimens
Additional details
Identifiers
- DOI
- 10.1063/1.4865244;
- arXiv
- arXiv:1311.2377v1;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 6
- Journal Page Range
- p. 062604-062604.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45104547
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRONS; MAGNETIC FLUX; QUANTUM ENTANGLEMENT; QUBITS; RADIATION EFFECTS; RADIOWAVE RADIATION; RESOLUTION; SQUID DEVICES; SUPERCONDUCTORS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; FLUXMETERS; INFORMATION; LEPTON BEAMS; LEPTONS; MEASURING INSTRUMENTS; MICROSCOPES; MICROSCOPY; MICROWAVE EQUIPMENT; PARTICLE BEAMS; QUANTUM INFORMATION; RADIATIONS; SUPERCONDUCTING DEVICES
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC