Published February 10, 2014 | Version v1
Journal article

Entanglement-assisted electron microscopy based on a flux qubit

  • 1. Department of Electronics and Information Systems, Akita Prefectural University, Yurihonjo 015-0055 (Japan)
  • 2. National Institute for Physiological Sciences, Okazaki 444-8787 (Japan)

Description

A notorious problem in high-resolution biological electron microscopy is radiation damage caused by probe electrons. Hence, acquisition of data with minimal number of electrons is of critical importance. Quantum approaches may represent the only way to improve the resolution in this context, but all proposed schemes to date demand delicate control of the electron beam in highly unconventional electron optics. Here we propose a scheme that involves a flux qubit based on a radio-frequency superconducting quantum interference device, inserted in a transmission electron microscope. The scheme significantly improves the prospect of realizing a quantum-enhanced electron microscope for radiation-sensitive specimens

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Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
104
Journal Issue
6
Journal Page Range
p. 062604-062604.4
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
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