Published May 2000 | Version v1
Miscellaneous Metadata-only

Analysis of superhard layers with secondary ion mass spectroscopy (SIMS)

Creators

Description

Different industrial relevant superhard coatings are investigated in this work with the goal to find reasons for occurred coating problems, find explanations for wanted or unwanted coating behaviors or just figure out coating inhomogeneities of any kind for further improvement. In detail, inhomogeneous boron incorporation as well as the adherence of diamond coatings, capability of BCN coatings applied as superhard coatings and analysis of the spatial structure of different superhard nitride coatings prepared with different methods have been examined by SIMS measurements. (author)

Availability note (English)

Available from Technische Univ. Wien Bibliothek, Wiedner Hauptstrasse 6-8, 1040 Vienna (AT)

Additional details

Publishing Information

Imprint Pagination
157 p.

INIS

Country of Publication
Austria
Country of Input or Organization
Austria
INIS RN
33011523
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Thesis, Non-conventional Literature
Descriptors DEI
BORON CARBIDES; BORON NITRIDES; COATINGS; DIAMONDS; ION MICROPROBE ANALYSIS; LAYERS; MASS SPECTROSCOPY
Descriptors DEC
BORON COMPOUNDS; CARBIDES; CARBON; CARBON COMPOUNDS; CHEMICAL ANALYSIS; ELEMENTS; MICROANALYSIS; MINERALS; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE ANALYSIS; NONMETALS; PNICTIDES; SPECTROSCOPY

Optional Information

Notes
Reference number: 586.167 II