Electron beam polarimetry
Creators
- 1. Jefferson Laboratory 12000 Jefferson Avenue, Newport News, Virginia, 23606 (United States)
Description
Along with its well known charge and mass, the electron also carries an intrinsic angular momentum, or spin. The rules of quantum mechanics allow us to measure only the probability that the electron spin is in one of two allowed spin states. When a beam carries a net excess of electrons in one of these two allowed spin states, the beam is said to be polarized. The beam polarization may be measured by observing a sufficient number of electrons scattered by a spin-dependent interaction. For electrons, the useful scattering processes involve Coulomb scattering by heavy nuclei, or scattering from either polarized photons or other polarized electrons (known as Mott, Compton, and Moeller scattering, respectively). In this tutorial, we will briefly review how beam polarization is measured through a general scattering process, followed by a discussion of how the three scattering processes above are used to measure electron beam polarization. Descriptions of electron polarimeters based on the three scattering processes will be given. copyright 1998 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 451
- Journal Issue
- 1
- Journal Page Range
- p. 23-39
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 8. beam instrumentation workshop (BIW-98)
- Dates
- 4-7 May 1998
- Place
- Stanford, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30038054
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM MONITORING; CEBAF ACCELERATOR; COMPTON EFFECT; ELECTRON BEAMS; MOTT SCATTERING; POLARIMETERS; POLARIMETRY; POLARIZED BEAMS
- Descriptors DEC
- ACCELERATORS; BASIC INTERACTIONS; BEAMS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; INTERACTIONS; LEPTON BEAMS; LINEAR ACCELERATORS; MONITORING; PARTICLE BEAMS; SCATTERING
Optional Information
- Secondary number(s)
- CONF-980573--