Glass-formation in the GeSe2-Sb2Se3-SnSe system
- 1. Department of Metallurgy of Non-Ferrous Metals and Semiconductor Technologies, University of Chemical Technology and Metallurgy, 8 Kl. Ohridsky Blvd., 1756 Sofia-56 (Bulgaria)
- 2. Department of Inorganic Chemistry, University of Chemical Technology and Metallurgy, 8 Kl. Ohridsky Blvd., 1756 Sofia-56 (Bulgaria)
- 3. Technical University of Sofia, Department of Thermal and Nuclear Power Engineering, 8 Kl. Ohridsky Blvd., 1000 Sofia (Bulgaria)
Description
The glass-formation in the pseudo-ternary GeSe2-Sb2Se3-SnSe system by the help of visual, X-ray diffraction and transmission electron microscopy (TEM) analyses was studied. The obtained chalcogenide glasses (ChG) were characterized with respect to their basic thermal (the glass-transition Tg, crystallization Tcr and melting Tm temperatures) and physicochemical (microhardness, HV and density, d) properties. On the basis of the experimental results obtained, some thermo-mechanical and structural parameters of the investigated glassy samples were calculated: modulus of elasticity (E), compactness (C), volume of the micro-voids (Vh) and the energy for their formation (Eh). Glass-formation ability of the ChGs was evaluated using the Hruby's criterion (KG). The composition-properties relationships are discussed in terms of the structural considerations.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2009.06.029Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2009.06.029;
- PII
- S0925-8388(09)01174-8;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 485
- Journal Issue
- 1-2
- Journal Page Range
- p. 569-572
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41119542
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANTIMONY SELENIDES; CRYSTALLIZATION; ELASTICITY; GERMANIUM SELENIDES; GLASS; MELTING; MICROHARDNESS; SEMICONDUCTOR MATERIALS; TIN SELENIDES; TRANSMISSION ELECTRON MICROSCOPY; VOIDS; X-RAY DIFFRACTION
- Descriptors DEC
- ANTIMONY COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; GERMANIUM COMPOUNDS; HARDNESS; MATERIALS; MECHANICAL PROPERTIES; MICROSCOPY; PHASE TRANSFORMATIONS; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.