Published April 1997
| Version v1
Journal article
Single electron capture cross sections measurement of C+, N+, O+ impact on H2 in the energy of 7.5-30 keV
- 1. Fudan Univ., Shanghai (China). Dept. of Nuclear Science and T.D. Lee Laboratory
Description
We set up the equipment measuring the single electron capture cross sections. The single electron capture cross sections for 7.5-30 keV C+, N+, O+ impact on H2 have been measured by the 'Growth Rate Method'. The experimental results at 30 keV are in good agreement with the recommended data. For ion energy less than 30 keV, the results are first reported
Additional details
Publishing Information
- Journal Title
- Chinese Journal of Atomic and Molecular Physics
- Journal Volume
- 14
- Journal Issue
- 2
- Journal Page Range
- p. 267-271.
- ISSN
- 1000-0364
- CODEN
- YYFXEM
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 28062940
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- CARBON IONS; CROSS SECTIONS; ELECTRON CAPTURE; HYDROGEN; ION-MOLECULE COLLISIONS; KEV RANGE 01-10; KEV RANGE 10-100; NITROGEN IONS; OXYGEN IONS
- Descriptors DEC
- CAPTURE; CHARGED PARTICLES; COLLISIONS; ELEMENTS; ENERGY RANGE; ION COLLISIONS; IONS; KEV RANGE; MOLECULE COLLISIONS; NONMETALS