Published September 1, 1993 | Version v1
Journal article

Oxygen tracer diffusion in YBa2Cu4O8

  • 1. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  • 2. Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801 (United States)
  • 3. Department of Physics, Northern Illinois University, DeKalb, Illinois 60115 (United States)
  • 4. Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

Description

Oxygen tracer diffusion has been measured in YBa2Cu4O8 (Y 1:2:4) polycrystals over a temperature range of 400 to 700 degree C in oxygen partial pressures (PO2) that varied between 103 and 105 Pa. Depth profiles were determined by secondary-ion mass spectrometry. The results can be described by an Arrhenius relationship with a pre-exponential of 0.08 cm2/s and an activation energy of 201 kJ/mole. The diffusion coefficient is a strong function of PO2, increasing as PO2 decreases. Oxygen diffuses several orders of magnitude more slowly in Y 1:2:4 than in YBa2Cu3O7-δ Y 1:2:3 with a higher pre-exponential and higher activation energy, and the clear dependence on PO2 indicates that diffusion of oxygen in polycrystalline Y 1:2:4 occurs by a different mechanism than in Y 1:2:3. The results of tracer measurements performed at 600 and 700 degree C on Y 1:2:4 c-axis single crystals indicate that diffusion in the c direction is at least 100 times slower than diffusion in the polycrystals and has a larger activation energy

Additional details

Publishing Information

Journal Title
Physical Review. B, Condensed Matter
Journal Volume
48
Journal Issue
10
Journal Page Range
p. 7505-7512.
ISSN
0163-1829
CODEN
PRBMDO