Real-time gamma radiation dosimetry using thin films of (In2O3)0.1(TeO2)0.9

The effect of gamma radiation on the current-voltage characteristics of the (In2O3)0.1(TeO2)0.9 thin films of different thicknesses, prepared by thermal evaporation in a vacuum, has been studied in detail for a wide range of the gamma radiation doses. Subsequently, for each film thickness at different applied voltages, the variations of current with the gamma radiation dose have been obtained. The current increases near linearly with the gamma radiation dose up to a critical radiation dose, a dose value higher for the thicker films and decreases thereafter. The absolute sensitivities of these thin films at applied voltages 2.4-4.8 V have been found to be in the range 35.0-210.0 μA/cm2/mGy. Correspondingly, the estimated detection limits have been found to be in the range 0.05-0.45 mGy. Clearly, these thin films have high potential for their use as real-time gamma radiation dosimeters in monitoring the gamma radiation doses under a variety of practical situations involving very low levels of the gamma radiation dose. (author)