Published June 15, 2012 | Version v1
Journal article

Conduction mechanisms in p-type Pb1-xEuxTe alloys in the insulator regime

  • 1. Departamento de Física e Química, Instituto de Ciências Exatas, Universidade Federal de Itajubá, Itajubá, PB 50, MG CEP 37500-903 (Brazil)
  • 2. Departamento de Física, ICEx, Universidade Federal de Minas Gerais, Belo Horizonte, PB 702, MG CEP 30123-970 (Brazil)
  • 3. Instituto de Física, Universidade de São Paulo, São Paulo, PB 66318, SP CEP 05315-970 (Brazil)
  • 4. Laboratório Associado de Sensores e Materiais, Instituto Nacional de Pesquisas Espaciais, São José dos Campos, PB 515, SP CEP 12201-970 (Brazil)

Description

Electrical resistivity measurements were performed on p-type Pb1-xEuxTe films with Eu content x = 4%, 5%, 6%, 8%, and 9%. The well-known metal-insulator transition that occurs around 5% at room temperature due to the introduction of Eu is observed, and we used the differential activation energy method to study the conduction mechanisms present in these samples. In the insulator regime (x > 6%), we found that band conduction is the dominating conduction mechanism for high temperatures with carriers excitation between the valence band and the 4f levels originated from the Eu atoms. We also verified that mix conduction dominates the low temperatures region. Samples with x = 4% and 5% present a temperature dependent metal insulator transition and we found that this dependence can be related to the relation between the thermal energy kBT and the activation energy Δεa. The physical description obtained through the activation energy analysis gives a new insight about the conduction mechanisms in insulating p-type Pb1-xEuxTe films and also shed some light over the influence of the 4f levels on the transport process in the insulator region.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
111
Journal Issue
12
Journal Page Range
p. 123708-123708.3
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2012 American Institute of Physics