Published February 2006 | Version v1
Journal article

X-ray topography of GdCa4O(BO3)3 single crystals grown by the Czochralski method

  • 1. Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw (Poland)
  • 2. Institute of Experimental Physics, University of Warsaw, Hoza 69, 00-681 Warsaw (Poland)

Description

GdCa4O(BO3)3 single crystals grown by the Czochralski technique were investigated by conventional transmission and back-reflection X-ray topography. The results were correlated with the growth conditions and stoichiometry of the crystals. Extended defects, especially dislocations, with different density, in samples cut perpendicular and parallel to the b-axis were investigated. Long, straight dislocations lying perpendicular to [100] and [010] directions were observed. Periodical, small fluctuations of the diameter induced some defects. (copyright 2006 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssa.200521030

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. A, Applied Research
Journal Volume
203
Journal Issue
2
Journal Page Range
p. 220-226
ISSN
0031-8965
CODEN
PSSABA

Optional Information

Notes
With 6 figs., 1 tab., 11 refs.. SICI: 0031-8965(200602)203:2<220::AID-PSSA200521030>3.0.TX;2-T