Published January 13, 2014 | Version v1
Journal article

Above-bandgap optical properties of biaxially strained GeSn alloys grown by molecular beam epitaxy

  • 1. Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583 (Singapore)
  • 2. Department of Physics, National University of Singapore, Singapore 117551 (Singapore)

Description

The complex dielectric function of biaxially strained Ge1−xSnx (0 ≤ x ≤ 0.17) alloys grown on Ge (100) has been determined by spectroscopic ellipsometry from 1.2 to 4.7 eV. The effect of substitutional Sn incorporation and the epitaxial strain on the energy transitions E1, E1 + Δ1, E0′, and E2 of GeSn alloys is investigated. Our results indicate that the strained GeSn alloys show Ge-like electronic bandstructure with all the transitions shifted downward due to the alloying of Sn. The strain dependence of E1 and E1 + Δ1 transitions is explained using the deformation potential theory, and values of −5.4 ± 0.4 eV and 3.8 ± 0.5 eV are obtained for the hydrostatic and shear deformation potentials, respectively

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
104
Journal Issue
2
Journal Page Range
p. 022111-022111.4
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45097078
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; DIELECTRIC MATERIALS; ELLIPSOMETRY; GERMANIUM; MOLECULAR BEAM EPITAXY; OPTICAL PROPERTIES; STRAINS; TIN
Descriptors DEC
CRYSTAL GROWTH METHODS; ELEMENTS; EPITAXY; MATERIALS; MEASURING METHODS; METALS; PHYSICAL PROPERTIES

Optional Information

Notes
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