Published January 13, 2014
| Version v1
Journal article
Above-bandgap optical properties of biaxially strained GeSn alloys grown by molecular beam epitaxy
- 1. Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583 (Singapore)
- 2. Department of Physics, National University of Singapore, Singapore 117551 (Singapore)
Description
The complex dielectric function of biaxially strained Ge1−xSnx (0 ≤ x ≤ 0.17) alloys grown on Ge (100) has been determined by spectroscopic ellipsometry from 1.2 to 4.7 eV. The effect of substitutional Sn incorporation and the epitaxial strain on the energy transitions E1, E1 + Δ1, E0′, and E2 of GeSn alloys is investigated. Our results indicate that the strained GeSn alloys show Ge-like electronic bandstructure with all the transitions shifted downward due to the alloying of Sn. The strain dependence of E1 and E1 + Δ1 transitions is explained using the deformation potential theory, and values of −5.4 ± 0.4 eV and 3.8 ± 0.5 eV are obtained for the hydrostatic and shear deformation potentials, respectively
Additional details
Identifiers
- DOI
- 10.1063/1.4862659;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 2
- Journal Page Range
- p. 022111-022111.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45097078
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; DIELECTRIC MATERIALS; ELLIPSOMETRY; GERMANIUM; MOLECULAR BEAM EPITAXY; OPTICAL PROPERTIES; STRAINS; TIN
- Descriptors DEC
- CRYSTAL GROWTH METHODS; ELEMENTS; EPITAXY; MATERIALS; MEASURING METHODS; METALS; PHYSICAL PROPERTIES
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC