Published 1987 | Version v1
Book

Extraction and focusing of an electron beam extracted from the duoplasmatron source

  • 1. Nuclear Research Center, Egyptian Atomic Energy Authority

Description

This work includes a study on electron beam extraction from the duoplasmatron source and its focusing by a magnetic lens. This study investigates the electron current below the magnetic lens under the influence of the discharge parameters, collector voltage and the focusing magnetic field. It is found that the influence of the filament power on increasing the electron current is obvious at V/sub c/ > 9 kv. The influence of the source magnetic field and pressure on the increase in electron current could be detected below the lens. The focusing magnetic field of the lens increases the electron current to a peak value at 600 gauss at pressure 6.5 X 10/sup -3/Torr and collector voltage 8 kv. It is found that the electron current below the lens (at zero magnetic field) is smaller than the current above it due to electron losses at low voltage. At collector potential > 9 kv and the use of the focusing magnetic field the electron losses could be lowered to zero value

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (USA)
Imprint Title
The 1987 IEEE international conference on plasma science (Abstracts)
Journal Page Range
p. 79.

Conference

Title
IEEE international conference on plasma science.
Dates
1-3 Jun 1987.
Place
Crystal City, VA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
19047717
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM CURRENTS; BEAM EXTRACTION; DUOPLASMATRONS; ELECTRON BEAMS; FOCUSING; MAGNETIC FIELDS; PARTICLE LOSSES
Descriptors DEC
BEAMS; CURRENTS; ELECTRON TUBES; ION SOURCES; LEPTON BEAMS; PARTICLE BEAMS; PLASMATRONS