Published July 15, 2008 | Version v1
Journal article

Direct laser interference patterning of multi-walled carbon nanotube-based transparent conductive coatings

  • 1. Leibniz Institute for New Materials GmbH (INM), Campus D2 2, D-66123 Saarbruecken (Germany)
  • 2. Department of Materials Science, Saarland University, Chair of Functional Materials, Building C6.3, 7th Floor, P.O. Box 15 11 50, D-66401 Saarbruecken (Germany)
  • 3. Engineered nanoProducts Germany AG (EPG), Max-Planck-Str. 2, D-66482 Zweibruecken (Germany)

Description

Topographical structures were created on the surface of multi-walled carbon nanotube-based coatings deposited on borosilicate glass using the direct laser interference patterning (DLIP) technique. Films made by multi-walled carbon nanotubes (MWNTs) dispersed in antimony-doped tin oxide (ATO) matrix and networks of MWNTs with both low and high adherence to the substrates were irradiated with one single laser pulse. Due to the high absorption coefficient of ATO, the film was completely removed at the interference maxima positions leading to periodic arrays of high quality on macroscopic areas. Additionally, increase of the laser fluence has produced wider ablated regions. Irradiation of high adherent networks of MWNTs produced a periodic porous structure, what has been attributed to the presence of adherence promoters in the film. On the other hand, MWNT networks with low adhesion to the substrate were strongly removed at the interference maxima positions. In this case, however, the fabricated periodic structures presented several defects that result from the poor adherence of the film to the substrate

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.03.140

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.03.140;
PII
S0169-4332(08)00638-7;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
254
Journal Issue
18
Journal Page Range
p. 5874-5878
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.