Published November 18, 2002 | Version v1
Journal article

Spatial coherence of currently available EUV/Soft X-ray sources

  • 1. Center for X-Ray Optics, Lawrence Berkeley National Lab, Berkeley, CA 94720 (United States)
  • 2. Applied Science and Technology Graduate Group, University of California, Berkeley, CA 94720 (United States)
  • 3. Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, CO 80523 (United States)
  • 4. NIST, Boulder, CO 80309 (United States)
  • 5. JILA, University of Colorado, Boulder, CO 80309 (United States)
  • 6. Department of Physics, University of Colorado, Boulder, CO 80309 (United States)

Description

Spatial coherence properties of 3 different kinds of coherent sources in extreme ultraviolet/soft x-ray wavelength region, namely undulator, x-ray laser and high harmonic generation source, are introduced. Advantages of each source type and their potential applications are also discussed

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
641
Journal Issue
1
Journal Page Range
p. 607-612
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
8. international conference on X-ray lasers
Dates
27-31 May 2002
Place
Aspen, CO (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35090969
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
HARMONIC GENERATION; SOFT X RADIATION; ULTRAVIOLET SPECTRA; VISIBLE RADIATION; X-RAY LASERS; X-RAY SOURCES
Descriptors DEC
ELECTROMAGNETIC RADIATION; FREQUENCY MIXING; IONIZING RADIATIONS; LASERS; RADIATION SOURCES; RADIATIONS; SPECTRA; X RADIATION

Optional Information

Notes
(c) 2002 American Institute of Physics