Published September 15, 1984 | Version v1
Journal article Metadata-only

The impact of microelectronics on particle detection

Creators

  • 1. European Organization for Nuclear Research, Geneva (Switzerland)

Description

Progress in microelectronics has an impact on silicon detector manufacturing technology and on detector system design. Noise performance, miniaturization and lower cost of hybrid or integrated front-end electronics enable thinner, segmented silicon detectors to be used for a number of new applications. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res., Sect. A
Journal Volume
226
Journal Issue
1
Series
CODEN: NIMRD.;Nucl. Instrum. Methods Phys. Res., Sect. A.
Journal Page Range
12-15
ISSN
0167-5087

Conference

Title
New developments in silicon detectors.
Acronym
2. European symposium on semiconductor detectors
Dates
14-16 Nov 1983.
Place
Muenchen (Germany, F.R.).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
16014896
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BACKGROUND NOISE; COUNTING CIRCUITS; FABRICATION; INTEGRATED CIRCUITS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS
Descriptors DEC
ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; NOISE; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS