Published January 1, 2009 | Version v1
Journal article

Path of ordering under confinement in alloy films

  • 1. Department of Physics and Key Laboratory of Atomic and Molecular Nanoscience (Ministry of Education), Tsinghua University, Beijing 100084 (China)
  • 2. Graduate School of Frontier Sciences, University of Tokyo, Tokyo (Japan)

Description

The effects of surface confinement on the kinetics of ordering in fcc alloy films are studied by the Monte Carlo method. Under weak surface confinement, there are two kinds of kinetic path for alloy films with even layer. One is the films directly relaxing to the equilibrium state, the other is the films relaxing to a metastable state first. Even for the same initial atomic configuration, the kinetic path of ordering is randomized, and the possibility that the films relax to a metastable state is independent with the initial atomic configurations. We attribute this randomicity to the competition between surface confinement and chemical ordering. The evolution of the metastable state to the equilibrium state is also simulated. The results indicate that an alloy film with weak surface segregation can easily be trapped into metastable state

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2008.09.103

Additional details

Identifiers

DOI
10.1016/j.tsf.2008.09.103;
PII
S0040-6090(08)01188-7;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
517
Journal Issue
5
Journal Page Range
p. 1848-1852
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40061807
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; CONFINEMENT; FCC LATTICES; FILMS; INTERFACES; KINETICS; LAYERS; METASTABLE STATES; MONTE CARLO METHOD; PHASE TRANSFORMATIONS; SEGREGATION; SIMULATION; SURFACES; THERMODYNAMICS
Descriptors DEC
CALCULATION METHODS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; ENERGY LEVELS; EXCITED STATES

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.