Collision of low energy Na+ ion with C60
Creators
- 1. Naval Medical Research Institute, Shanghai (China)
- 2. Chinese Academy of Sciences, Shanghai (China). Shanghai Inst. of Nuclear Research
Description
The collision-induced reaction of Na+ ion with neutral C60 vapour was investigated at the energy range of 10 to 150 eV. The deposited films were studied via laser desorption time-of-flight mass spectroscopy (TOFMS). The fragment products of C60 with even number of carbon atoms, such as Cn+ (n=58, 56, 54), and adduct products, such as Cn+ (n=62, 64, 66, 68) were observed in the positively charged TOF mass spectra. The endohedral fullerene ion of Na+C60+ was detected when collision energies are above 20 eV. Besides, no negative endohedral fullerene was detected, the products appearing in positively charged mass spectra were also observed in the negatively charged mass spectra. In addition, a series of products with odd number of carbon atoms, such as Cn- (n=53, 55, 57, 59, 61, 63, 65, 67), also appeared, but the intensities of their signals were not as high as that of even numbered. Finally, it is interesting to find that the deposited films are insoluable in toluene, benzene or water. Their Fourier transform infrared (FTIR) spectra seem like those photopolymerized ones. Some of the reaction schemes are proposed to explain the experimental reuslts
Additional details
Publishing Information
- Journal Title
- Nuclear Science and Techniques
- Journal Volume
- 13
- Journal Issue
- 3
- Journal Page Range
- p. 134-142
- ISSN
- 1001-8042
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 34078790
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- CARBON; EV RANGE; FILMS; FULLERENES; ION-ATOM COLLISIONS; MASS SPECTRA; SODIUM IONS; TIME-OF-FLIGHT MASS SPECTROMETERS
- Descriptors DEC
- ATOM COLLISIONS; CARBON; CHARGED PARTICLES; COLLISIONS; DYNAMIC MASS SPECTROMETERS; ELEMENTS; ENERGY RANGE; ION COLLISIONS; IONS; MASS SPECTROMETERS; MEASURING INSTRUMENTS; NONMETALS; SPECTRA; SPECTROMETERS; TIME-OF-FLIGHT SPECTROMETERS