Published July 2010 | Version v1
Journal article Metadata-only

The surface state of URu2Si2

Creators

  • 1. Lehrstuhl fuer Experimentelle Physik VII, Universitaet Wuerzburg, Am Hubland, D-97074 Wuerzburg (Germany)
  • 2. Laboratoire Photons et Matiere, UPR-5 CNRS, ESPCI, 10 rue Vanquelin, 75231 Paris Cedex 5 (France)
  • 3. CSNSM, Universite Paris-Sud and CNRS/IN2P3, Batiments 104 et 108, 91405 Orsay cedex (France)
  • 4. Institut Neel, CNRS/UJF, B.P. 166, 38042 Grenoble Cedex 9 (France)
  • 5. Forschungszentrum Karlsruhe, Gemeinschaftslabor fuer Nanoanalythik, D-76021 Karlsruhe (Germany)

Description

The 'hidden-order' (HO) transition of URu2Si2 remains a puzzle after 25 years of research. Using high-resolution angle-resolved photoemission spectroscopy (ARPES) we found that a hole-like band around Γ having its band maximum at E = -35 meV, and previously thought to be a bulk band of the system, is indeed a surface state not related to the HO phase transition. Here we present our detailed investigations to assign that state to a surface feature, and discuss on the possible origins of this surface band.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2010.05.016

Additional details

Identifiers

DOI
10.1016/j.elspec.2010.05.016;
PII
S0368-2048(10)00117-9;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
181
Journal Issue
1
Journal Page Range
p. 82-87
ISSN
0368-2048
CODEN
JESRAW

Conference

Title
International workshop on strong correlations and angle-resolved photoemission spectroscopy 2009
Dates
19-24 Jul 2009
Place
Zurich (Switzerland)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42014639
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
EMISSION SPECTROSCOPY; PHASE TRANSFORMATIONS; PHOTOEMISSION; SURFACES
Descriptors DEC
EMISSION; SECONDARY EMISSION; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.