Published February 1997
| Version v1
Journal article
Depth determination of Fe+ ions implanted into wheat seeds using characteristic X-ray spectrum method
Creators
- 1. Academia Sinica, Lanzhou, GS (China). Inst. of Modern Physics
Description
The intensity distribution of characteristic X-rays from Fe element at different depths of embryo of a wheat seed implanted vertically by 110 keV Fe+ ions was measured in SEM along the longitudinal channel section. It was shown that the distribution was of exponential decrease similar to the case of thermal diffusion in crystals
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 20
- Journal Issue
- 2
- Journal Page Range
- p. 105-108.
- ISSN
- 0253-3219
- CODEN
- NUTEDL
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 28041498
- Subject category
- S63: RADIATION, THERMAL, AND OTHER ENVIRONMENTAL POLLUTANT EFFECTS ON LIVING ORGANISMS AND BIOLOGICAL MATERIALS;
- Descriptors DEI
- DEPTH; EMBRYOS; ION IMPLANTATION; IRON IONS; KEV RANGE 100-1000; SCANNING ELECTRON MICROSCOPY; SEEDS; SPATIAL DISTRIBUTION; WHEAT; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CEREALS; CHARGED PARTICLES; CHEMICAL ANALYSIS; DIMENSIONS; DISTRIBUTION; ELECTRON MICROSCOPY; ENERGY RANGE; GRAMINEAE; IONS; KEV RANGE; LILIOPSIDA; MAGNOLIOPHYTA; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; PLANTS; X-RAY EMISSION ANALYSIS