Published December 1986 | Version v1
Journal article Metadata-only

Orientation determination in very small volumes using synchrotron radiation

Creators

  • 1. Dept. of Metallurgy, Mechanics and Materials Science Michigan State Univ., East Lansing, MI 48824

Description

The current investigation explores the application of synchrotron radiation for the purpose of small volume x-ray diffraction, since the brilliance of synchrotron radiation is several orders of magnitude higher than from conventional x-ray generators

Additional details

Publishing Information

Journal Title
Scr. Metall.
Journal Volume
20
Journal Issue
12
Series
Scr. Metall.
Journal Page Range
1791-1794
ISSN
0036-9748
CODEN
SCRMB

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
18045119
Subject category
S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
CRYSTAL LATTICES; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN ORIENTATION; MECHANICAL PROPERTIES; METALS; PHYSICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SYNCHROTRON RADIATION; THIN FILMS; VOLUME; X-RAY DIFFRACTION
Descriptors DEC
BREMSSTRAHLUNG; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; MICROSCOPY; MICROSTRUCTURE; ORIENTATION; RADIATIONS; SCATTERING