Published July 1991 | Version v1
Journal article

Adhesion improvement of Au on GaAs using ion beam assisted deposition

  • 1. IBM Almaden Research Center, San Jose, CA (USA)
  • 2. Lockheed Research and Development Div., Palo Alto, CA (USA)

Description

Ion beam assisted deposition (IBAD) has been applied to create strongly adhering Au-GaAs interfaces at low temperatures (120-150degC), which display excellent Schottky barrier height and ideality factor. The interface thus created is believed to involve Au-Ga bonding, and its extent is limited to a depth of a few monolayers. The adhesion produced depends critically on substrate temperature and on the arrival rate ratio of Ar ions to Au atoms at the substrate. The mechanism of the interface complex formation is not yet determined; however, it is postulated that surface disorder created by the ion beam contributes critically to enabling the chemical displacement of As by Au at the GaAs surface. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research, Section B
Journal Volume
59/60
Journal Issue
pt.1
Series
Nucl. Instrum. Methods Phys. Res., Sect. B.
Journal Page Range
249-253
ISSN
0168-583X
CODEN
NIMBE

Conference

Title
7. international conference on ion beam modification of materials (IBMM-7) and exposition.
Dates
9-14 Sep 1990.
Place
Knoxville, TN (United States).