Published July 1991
| Version v1
Journal article
Adhesion improvement of Au on GaAs using ion beam assisted deposition
- 1. IBM Almaden Research Center, San Jose, CA (USA)
- 2. Lockheed Research and Development Div., Palo Alto, CA (USA)
Description
Ion beam assisted deposition (IBAD) has been applied to create strongly adhering Au-GaAs interfaces at low temperatures (120-150degC), which display excellent Schottky barrier height and ideality factor. The interface thus created is believed to involve Au-Ga bonding, and its extent is limited to a depth of a few monolayers. The adhesion produced depends critically on substrate temperature and on the arrival rate ratio of Ar ions to Au atoms at the substrate. The mechanism of the interface complex formation is not yet determined; however, it is postulated that surface disorder created by the ion beam contributes critically to enabling the chemical displacement of As by Au at the GaAs surface. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section B
- Journal Volume
- 59/60
- Journal Issue
- pt.1
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. B.
- Journal Page Range
- 249-253
- ISSN
- 0168-583X
- CODEN
- NIMBE
Conference
- Title
- 7. international conference on ion beam modification of materials (IBMM-7) and exposition.
- Dates
- 9-14 Sep 1990.
- Place
- Knoxville, TN (United States).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 23000352
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADHESION; ARGON IONS; DEPOSITION; GALLIUM ARSENIDES; GOLD; HIGH TEMPERATURE; INTERFACES; ION BEAMS; ION IMPLANTATION; MEDIUM TEMPERATURE; SCHOTTKY BARRIER DIODES; SPUTTERING; SUBSTRATES; TEMPERATURE DEPENDENCE; TRANSMISSION ELECTRON MICROSCO; X-RAY DIFFRACTION
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; BEAMS; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; GALLIUM COMPOUNDS; IONS; METALS; MICROSCOPY; PNICTIDES; SCATTERING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TRANSITION ELEMENTS