Published September 2013
| Version v1
Journal article
Microstructure and deformation mechanisms in nanocrystalline Ni–Fe. Part I. Microstructure
Creators
- 1. Materials Science and Simulations, NUM/ASQ, Paul Scherrer Institut, CH-5232 Villigen (Switzerland)
- 2. CEMES-CNRS, 29 rue J. Marvig, 31055 Toulouse (France)
- 3. University of Rouen, CNRS UMR 6634, Groupe de Physique des Matériaux, Faculté des Sciences, BP12, 76801 Saint-Etienne du Rouvray (France)
- 4. NXMM, IMX, Ecole Polytechnique Fédéral de Lausanne, CH-1015 Lausanne (Switzerland)
Description
We investigate various microstructural features of nanocrystalline electrodeposited Ni–Fe with a nominal iron content of 50% and compare them with the well-known nanocrystalline Ni system. In-depth electron microscopy analysis reveals the existence of large strain variations in the grain interior. Three-dimensional atom probe studies demonstrate no significant segregation to grain boundaries. However, significant deviations from a perfect chemically disordered system are found, which can be related to compositional variations of 5% over length scales of only a few nanometres. Finally, X-ray diffraction measurements suggest higher dislocation and twin density in Ni–Fe compared to Ni
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2013.06.031Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2013.06.031;
- PII
- S1359-6454(13)00463-1;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 61
- Journal Issue
- 15
- Journal Page Range
- p. 5835-5845
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45038021
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTALS; DEFORMATION; ELECTRODEPOSITION; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; NANOSTRUCTURES; STRAINS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROLYSIS; LYSIS; MICROSCOPY; MICROSTRUCTURE; SCATTERING; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.