Published September 2013 | Version v1
Journal article

Microstructure and deformation mechanisms in nanocrystalline Ni–Fe. Part I. Microstructure

  • 1. Materials Science and Simulations, NUM/ASQ, Paul Scherrer Institut, CH-5232 Villigen (Switzerland)
  • 2. CEMES-CNRS, 29 rue J. Marvig, 31055 Toulouse (France)
  • 3. University of Rouen, CNRS UMR 6634, Groupe de Physique des Matériaux, Faculté des Sciences, BP12, 76801 Saint-Etienne du Rouvray (France)
  • 4. NXMM, IMX, Ecole Polytechnique Fédéral de Lausanne, CH-1015 Lausanne (Switzerland)

Description

We investigate various microstructural features of nanocrystalline electrodeposited Ni–Fe with a nominal iron content of 50% and compare them with the well-known nanocrystalline Ni system. In-depth electron microscopy analysis reveals the existence of large strain variations in the grain interior. Three-dimensional atom probe studies demonstrate no significant segregation to grain boundaries. However, significant deviations from a perfect chemically disordered system are found, which can be related to compositional variations of 5% over length scales of only a few nanometres. Finally, X-ray diffraction measurements suggest higher dislocation and twin density in Ni–Fe compared to Ni

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2013.06.031

Additional details

Identifiers

DOI
10.1016/j.actamat.2013.06.031;
PII
S1359-6454(13)00463-1;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
61
Journal Issue
15
Journal Page Range
p. 5835-5845
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45038021
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CRYSTALS; DEFORMATION; ELECTRODEPOSITION; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; NANOSTRUCTURES; STRAINS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROLYSIS; LYSIS; MICROSCOPY; MICROSTRUCTURE; SCATTERING; SURFACE COATING

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.