Published December 2019 | Version v1
Journal article

Tomographic layer-by-layer analysis of epitaxial iron-silicide nanostructures by DFT-assisted STS

  • 1. Department of Materials Science and Engineering, Faculty of Engineering, Tel Aviv University, Tel Aviv 6997801 (Israel)
  • 2. The Raymond and Beverly Sackler Center for Computational Molecular and Materials Science, Tel Aviv University, Tel Aviv 6997801 (Israel)
  • 3. Department of Materials Science and Engineering, Michigan Technological University (United States)
  • 4. Department of Physics, Michigan Technological University (United States)

Description

Surface science techniques (STM, STS, and XPS) were combined with ab initio simulations to detect the local crystal structure and chemistry. Solid phase epitaxy of iron on vicinal Si(111) substrate resulted in the formation of 3×3R30° nanoislands and (2×2) films of γ-FeSi2(111). We identify these structures by comparing experimental normalized derivative conductance curves with tomographic simulated local density of states (LDOS). The thermodynamic tendency of γ-FeSi2(111) towards Si rich surfaces is manifested in Si rich termination layers and reconstructions. We show that a weighted average of the LDOS from the Fe layer and the reconstruction layer can explain the main states in the normalized derivative conductance curves, enabling in-situ identification of crystal structure and composition of epitaxial deposits.

Additional details

Identifiers

DOI
10.1016/j.apsusc.2019.143583;
PII
S0169433219323803;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
496
Journal Page Range
vp.
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.