Tomographic layer-by-layer analysis of epitaxial iron-silicide nanostructures by DFT-assisted STS
Creators
- 1. Department of Materials Science and Engineering, Faculty of Engineering, Tel Aviv University, Tel Aviv 6997801 (Israel)
- 2. The Raymond and Beverly Sackler Center for Computational Molecular and Materials Science, Tel Aviv University, Tel Aviv 6997801 (Israel)
- 3. Department of Materials Science and Engineering, Michigan Technological University (United States)
- 4. Department of Physics, Michigan Technological University (United States)
Description
Surface science techniques (STM, STS, and XPS) were combined with ab initio simulations to detect the local crystal structure and chemistry. Solid phase epitaxy of iron on vicinal Si(111) substrate resulted in the formation of R30° nanoislands and (2×2) films of γ-FeSi2(111). We identify these structures by comparing experimental normalized derivative conductance curves with tomographic simulated local density of states (LDOS). The thermodynamic tendency of γ-FeSi2(111) towards Si rich surfaces is manifested in Si rich termination layers and reconstructions. We show that a weighted average of the LDOS from the Fe layer and the reconstruction layer can explain the main states in the normalized derivative conductance curves, enabling in-situ identification of crystal structure and composition of epitaxial deposits.
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2019.143583;
- PII
- S0169433219323803;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 496
- Journal Page Range
- vp.
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55101275
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL STRUCTURE; DENSITY FUNCTIONAL METHOD; DENSITY OF STATES; EPITAXY; IRON SILICIDES; NANOSTRUCTURES; SCANNING TUNNELING MICROSCOPY; THERMODYNAMICS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CALCULATION METHODS; CRYSTAL GROWTH METHODS; ELECTRON SPECTROSCOPY; IRON COMPOUNDS; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; SILICIDES; SILICON COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.