Published October 1991 | Version v1
Journal article Metadata-only

Recommendations on choice of NaI(Tl) crystal thickness to control weak short-term photon fluxes

Creators

  • 1. Vsesoyuznyj Nauchno-Issledovatel'skij Inst. Neorganicheskikh Materialov, Moscow (Russian Federation)

Description

Detectors with NaI(Tl) crystal are widely used for radiation monitoring at NPP to reveal short-term and insufficient excess of photon flux over the background. Curve characterizing the dependence of optimal thickness of NaI(Tl) crystal 80 mm in-diameter on detected photon energy is presented. The correct choice of crystal thickness provides for the minimal measurement time and the minimal relative error

Additional details

Additional titles

Original title (Russian)
Выбор толщины кристалла NaI(Тл) при регистрации слабых кратковременных потоков фотонов

Publishing Information

Journal Title
Atomnaya Ehnergiya
Journal Volume
71
Journal Issue
4
Journal Page Range
p. 343.
ISSN
0004-7163
CODEN
AENGAB

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
24059802
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ENERGY DEPENDENCE; GAMMA DETECTION; NAI DETECTORS; OPTIMIZATION; THICKNESS
Descriptors DEC
DETECTION; DIMENSIONS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SCINTILLATION COUNTERS; SOLID SCINTILLATION DETECTORS