Published June 2008
| Version v1
Journal article
The damage mechanisms of fused silica irradiated by 355 nm laser in vacuum
Creators
- 1. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054 (China)
- 2. Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900 (China)
Description
After pre-irradiation in 10-5 Torr vacuum, the 355 nm laser-induced damage threshold of fused silica decreased, while in air the damage resistance performance increased. The structure and defects of fused silica has been studied by means of Fourier transform infrared, Raman and Photoluminescence spectroscopy. The damage mechanisms are discussed
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2008.03.192Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2008.03.192;
- PII
- S0168-583X(08)00420-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 266
- Journal Issue
- 12-13
- Journal Page Range
- p. 2936-2940
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 14. international conference on radiation effects in insulators
- Acronym
- REI-14
- Dates
- 28 Aug - 1 Sep 2007
- Place
- Caen (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40011880
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DAMAGE; DEFECTS; FLUORESCENCE SPECTROSCOPY; FOURIER TRANSFORMATION; INFRARED SPECTRA; IRRADIATION; LASERS; PERFORMANCE; PHOTOLUMINESCENCE; RAMAN EFFECT; SILICA; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ELECTRON SPECTROSCOPY; EMISSION; EMISSION SPECTROSCOPY; INTEGRAL TRANSFORMATIONS; LUMINESCENCE; MINERALS; OXIDE MINERALS; PHOTOELECTRON SPECTROSCOPY; PHOTON EMISSION; SPECTRA; SPECTROSCOPY; TRANSFORMATIONS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.