Rapid deformation of thin gold layers in polymer matrices studied by x-ray reflectivity
Creators
- 1. National Institute of Standards and Technology, 100 Bureau Dr., Gaithersburg, Maryland 20899 (United States)
- 2. Department of Materials Science and Engineering, Kwangju Institute of Science and Technology, 500-712, Gwang-ju (Korea, Republic of)
Description
We have used x-ray reflectivity to measure the morphological profiles of thin Au layers of three different average thicknesses sandwiched between two polystyrene layers with different molecular weights. The results showed that the equilibrium structures of the samples with the layers less than 4 nm thick, where discontinuous islands are expected, were very close to those of the nonannealed samples. However, the morphologies of samples with layers more than 4 nm thick, where a continuous layer structure was formed, were influenced by annealing. Comparison of transmission electron micrographs from unannealed and annealed samples showed that annealing promotes spherical shapes for the Au particles and breakup of an elongated, randomly connected structure visible prior to the annealing. The fractional area covered with Au obtained from transmission electron microscopy images is in good agreement with x-ray reflectivity results. These results were interpreted in terms of capillarity induced spheroidization of the ultrathin Au layers
Additional details
Identifiers
- DOI
- 10.1063/1.1591414;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 94
- Journal Issue
- 3
- Journal Page Range
- p. 2115-2122
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35060416
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; DEFORMATION; GOLD; LAYERS; MOLECULAR WEIGHT; MORPHOLOGY; NANOSTRUCTURES; PARTICLES; POLYSTYRENE; REFLECTION; REFLECTIVITY; THICKNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HEAT TREATMENTS; MATERIALS; METALS; MICROSCOPY; OPTICAL PROPERTIES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; PHYSICAL PROPERTIES; PLASTICS; POLYMERS; POLYOLEFINS; POLYVINYLS; SURFACE PROPERTIES; SYNTHETIC MATERIALS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2003 American Institute of Physics.