Published December 2009 | Version v1
Journal article Metadata-only

Ex-site characterization of thin file materials for advanced devices by hard x-ray photoemission spectroscopy

Creators

  • 1. National Inst. for Mateirals Science, Beamline Station at SPring-8, Sayo, Hyogo (Japan)
  • 2. Japan Synchrotron Radiation Research Inst., SPring-8, Sayo, Hyogo (Japan)

Description

Hard X-ray photoemission spectroscopy (HXPS) with high-resolution, high-throughput and large photoelectron attenuation length has been developed at SPring-8 utilizing high brilliant undulator X-rays. This enhanced versatility of the photoemission spectroscopy, enabling to apply to laboratory prepared thin films and nano-structured samples of advanced materials. We will introduce wide varieties of experimental results on advance materials performed at JASRI public beamline BL47XU and NIMS contract beamline BL15XU of SPring-8. (author)

Availability note (English)

Available from http://dx.doi.org/10.3131/jvsj2.52.652

Additional details

Identifiers

DOI
10.3131/jvsj2.52.652;

Publishing Information

Journal Title
Journal of the Vacuum Society of Japan
Journal Volume
52
Journal Issue
12
Journal Page Range
p. 652-660
ISSN
1882-2398

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
41074538
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
AMORPHOUS STATE; BINDING ENERGY; DENSITY FUNCTIONAL METHOD; FERMI LEVEL; GERMANIUM TELLURIDES; HARD X RADIATION; INTERFACES; KINETIC ENERGY; MAGNESIUM OXIDES; PHOTOEMISSION; SILICON OXIDES; SPRING-8 STORAGE RING; SUBSTRATES; WIGGLER MAGNETS; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC SULFIDES
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; CALCULATION METHODS; CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; EMISSION; ENERGY; ENERGY LEVELS; EQUIPMENT; GERMANIUM COMPOUNDS; INORGANIC PHOSPHORS; IONIZING RADIATIONS; MAGNESIUM COMPOUNDS; MAGNETS; OXIDES; OXYGEN COMPOUNDS; PHOSPHORS; PHOTOELECTRON SPECTROSCOPY; RADIATION SOURCES; RADIATIONS; SECONDARY EMISSION; SILICON COMPOUNDS; SPECTROSCOPY; STORAGE RINGS; SULFIDES; SULFUR COMPOUNDS; SYNCHROTRON RADIATION SOURCES; TELLURIDES; TELLURIUM COMPOUNDS; VARIATIONAL METHODS; X RADIATION; ZINC COMPOUNDS

Optional Information

Notes
17 refs., 12 figs.